Exposure and analysis of microparticles embedded in silica aerogel keystones using NF3-mediated electron beam-induced etching and energy-dispersive X-ray spectroscopy-Reference-Cited by-同舟云学术

Exposure and analysis of microparticles embedded in silica aerogel keystones using NF3-mediated electron beam-induced etching and energy-dispersive X-ray spectroscopy

Published:2016-04-29 Issue:7 Volume:51 Page:1223-1232
ISSN:1086-9379
Container-title:Meteoritics & Planetary Science
language:en
Short-container-title:Meteorit Planet Sci

Author:

Martin Aiden A.¹,Lin Ting²,Toth Milos¹,Westphal Andrew J.³,Vicenzi Edward P.⁴,Beeman Jeffrey⁵,Silver Eric H.²

Affiliation:

1. School of Physics and Advanced Materials; University of Technology, Sydney; 15 Broadway Ultimo New South Wales 2007 Australia

2. Harvard-Smithsonian Center for Astrophysics; 60 Garden Street Cambridge Massachusetts 02138 USA

3. Space Sciences Laboratory; University of California at Berkeley; Berkeley California 94720 USA

4. Smithsonian Institution; Museum Conservation Institute; 4210 Silver Hill Road Suitland California 20746 USA

5. Materials Sciences Division; Lawrence Berkeley National Laboratory; Berkeley California 94720 USA

Funder

National Aeronautics and Space Administration

Science and Industry Endowment Fund

Publisher

Wiley

Subject

Space and Planetary Science,Geophysics

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/maps.12655/fullpdf

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