Relation Between Grain Boundary Structure and Electrical Degradation in Zinc Oxide Varistors
Author:
Affiliation:
1. Department of Electronics; Doshisha University; 1-3 Tatara Miyakodani; Kyotanabe; 610-0321; Japan
Publisher
Wiley
Subject
Materials Chemistry,Ceramics and Composites
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1551-2916.2012.05212.x/fullpdf
Reference18 articles.
1. Conduction Mechanism of Non-Ohmic Zinc-Oxide Ceramics;Eda;J. Appl. Phys.,1978
2. Degradation Mechanism of Non-Ohmic Zinc Oxide Ceramics;Eda;J. Appl. Phys.,1980
3. The Deep Level Transient Spectroscopy Studies of a ZnO Varistor as a Function of Annealing;Rohatgi;J. Appl. Phys.,1988
4. Impulse-Degradation Analysis of ZnO-Based Varistors by AC Impedance Measurements;Bui;J. Phys. D Appl. Phys.,1991
5. Comparative Degradation of ZnO- and SnO2-Based Polycrystalline Non-Ohmic Devices by Current Pulse Stress;Ramírez;J. Phys. D Appl. Phys.,2008
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