High Speed SPM Applied for Direct Nanoscale Mapping of the Influence of Defects on Ferroelectric Switching Dynamics
Author:
Affiliation:
1. Institute of Materials Science; University of Connecticut; Storrs; Connecticut
Publisher
Wiley
Subject
Materials Chemistry,Ceramics and Composites
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1551-2916.2012.05099.x/fullpdf
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