Multielement Mapping of α-SiC by Scanning Auger Microscopy-Reference-Cited by-同舟云学术

Multielement Mapping of α-SiC by Scanning Auger Microscopy

Published:1987-10 Issue:4 Volume:2 Page:773-779
ISSN:0883-5551
Container-title:Advanced Ceramic Materials
language:en
Short-container-title:

Author:

BROWNING RAY,SMIALEK JAMES L.,JACOBSON NATHAN S.

Publisher

Wiley

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1551-2916.1987.tb00145.x/fullpdf

Reference13 articles.

1. R. F. Davis et al. Microanalytical and Microstructural Analyses of Boron and Aluminum Regions in Sintered Alpha Silicon Carbide Scanning Electron Microsc. , Part 3 1161 67 1984

2. Auger Analysis of Hot-Pressed and Sintered Silicon Carbide;Sherman;J. Am. Ceram. Soc.,1985

3. Hot Corrosion of Sintered α-SiC at 1000°C;Jacobson;J. Am. Ceram. Soc.,1985

4. Microanalytical Investigation of Sintered SiC, Part I, Bulk Material and Inclusions;Hamminger;J. Mater. Sci.,1983

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