1. 1 K. M. Johnson , “Variation of Dielectric Constant with Voltage in Ferroelectrics and its Application to Parametric Devices,” J. Appl. Phys., 33, 2826-31 (1962).
2. 2 X. X. Xi , H. C. Li , W. D. Si , A. A. Sirenko , I. A. Akimov , J. R. Fox , A. M. Clark , and J. H. Hao , “Oxide Thin Films for Tunable Microwave Devices,” J. Electroceram., 4, 393-405 (2000).
3. 3 M. Dawber , K. M. Rabe , and J. F. Scott , “Physics of Thin-Film Ferroelectric Oxides,” Rev. Mod. Phys., 77, 1083-130 (2005).
4. 4 A. K. Tagantsev , V. O. Sherman , K. F. Astafiev , J. Venkatesh , and N. Setter , “Ferroelectric Materials for Microwave Tunable Applications,” J. Electroceram., 11, 5-66 (2003).
5. 5 B. H. Park , E. J. Peterson , Q. X. Jia , J. Lee , X. Zeng , W. Si , and X. X. Xi , “Effects of Very Thin Strain Layers on Dielectric Properties of Epitaxial Ba0.6Sr0.4TiO3 Films,” Appl. Phys. Lett., 78, 533-5 (2001).