Quantitative X-Ray Spectrum Imaging of Lead Lanthanum Zirconate Titanate PLZT Thin-Films-Reference-Cited by-同舟云学术

Quantitative X-Ray Spectrum Imaging of Lead Lanthanum Zirconate Titanate PLZT Thin-Films

Published:2008-11 Issue:11 Volume:91 Page:3690-3697
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:

Author:

Parish Chad M.,Brennecka Geoff L.,Tuttle Bruce A.,Brewer Luke N.

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1551-2916.2008.02708.x/fullpdf

Reference59 articles.

1. Phase Equilibrium in the System PbO-TiO2-ZrO2;Fushimi,1967

2. Intrinsic Nonstoichiometry in Lead Zirconate Titanate System Determined by Knudsen Effusion;Holman,1973

3. Improvements in Atmosphere Sintering of Transparent PLZT Ceramics;Snow,1973

4. Effects of Excess Pb and Substrate on Crystallization Processes of Amorphous Pb(Zr,Ti)O3 Thin Films Prepared by RF Magnetron Sputtering;Fukuda,1997

5. Use of Transmission Electron-Microscopy for the Characterization of Rapid Thermally Annealed, Solution-Gel, Lead-Zirconate-Titanate Films;Reaney,1994

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