Crystallization Behavior and Dielectric Properties of a New High Dielectric Constant Low-Temperature Cofired Ceramics Material Based on Nd2O3-TiO2-SiO2 Glass-Ceramics-Reference-Cited by-同舟云学术

Crystallization Behavior and Dielectric Properties of a New High Dielectric Constant Low-Temperature Cofired Ceramics Material Based on Nd2O3-TiO2-SiO2 Glass-Ceramics

Published:2010-03-29 Issue: Volume: Page:no-no
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:

Author:

Hsiang Hsing-I.,Mei Li-Then,Liao Wen-Chang,Yen Fu-Su

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1551-2916.2010.03655.x/fullpdf

Reference10 articles.

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2. Design of an LTCC Tri-Band Transceiver Module for GPRS Mobile Applications;Lin;IEEE Trans. Microw. Theory Technol.,2004

3. Crystallization Kinetics and Mechanism of Low-Dielectric, Low-Temperature, Cofirable CaO-B2O3-SiO2 Glass-Ceramics;Chang;J. Am. Ceram. Soc.,1999

4. Low-Temperature Sintering and Microwave Dielectric Properties of Anorthite-Based Glass-Ceramics;Lo;J. Am. Ceram. Soc.,2002

5. Synthesis and Microwave Dielectric Properties of La2O3-xB2O3-Based Melt Mixtures for Low-Temperature Cofired Ceramics;Takada;Jpn. J. Appl. Phys.,2005

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