Metrological challenges for reconstruction of 3-D microstructures by focused ion beam tomography methods-Reference-Cited by-同舟云学术

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Metrological challenges for reconstruction of 3-D microstructures by focused ion beam tomography methods

Published:2013-12-05 Issue:2 Volume:253 Page:93-108
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

MINGARD K.P.¹,JONES H.G.¹,GEE M.G.¹

Affiliation:

1. National Physical Laboratory; Hampton Road; Teddington, Middlesex TW11 OLW U. K.

Funder

National Measurement Office of the UK Government Department of Business, Innovation and Skills

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12100/fullpdf

Reference54 articles.

1. Minimizing damage during FIB sample preparation of soft materials;Bassim;J. Microsc.,2011

2. A 3D view of WC grains in Cemented Carbides;Borgh;Acta. Mater.,2013

3. An improved method to identify grain boundary creep cavitation in 316H austentic stainless steel;Chen;Ultramicroscopy,2011

4. The use of combined three-dimensional electron backscatter diffraction and energy dispersive X-ray analysis to assess the characteristics of the gamma/gamma-prime microstructure in alloy 720Li;Child;Ultramicroscopy,2012

5. X-ray microtomography studies of localised corrosion and transitions to stress corrosion cracking

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