Noise coefficients of backscattered electron detectors for low voltage scanning electron microscopy

Author:

HEJNA J.1

Affiliation:

1. Institute of Material Science and Applied Mechanics; Wrocław University of Technology; Smoluchowskiego 25 50-370 Wrocław Poland

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Reference34 articles.

1. Measurement technique for the incident electron current in secondary electron detectors and its application in SEM;Agemura;Scanning,2001

2. High-resolution low-voltage scanning electron microscope study of nanostructured materials;Asahina;Microsc. Anal.,2012

3. Detectors for low voltage scanning electron microscopy;Autrata;Scanning,1991

4. Comparison of the noise of different electron detection systems using scintillator-photomultiplier combination;Baumann;Scanning,1981

5. An alternative method for obtaining converted back-scattered electron images and other uses for specimen biasing in biological SEM;Boyde;Scanning Electron Microscopy 1980/I, SEM Inc., AMF O'Hare, Chicago,1980

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