High‐accuracy, direct aberration determination using self‐attention‐armed deep convolutional neural networks-Reference-Cited by-同舟云学术

High‐accuracy, direct aberration determination using self‐attention‐armed deep convolutional neural networks

Published:2022-01-25 Issue:1 Volume:286 Page:13-21
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

Wang Yangyundou¹²^ORCID,Wang Hao³,Li Yiming³,Hu Chuanfei³,Yang Hui³,Gu Min¹²^ORCID

Affiliation:

1. Institute of Photonic Chips, University of Shanghai for Science and Technology Shanghai China

2. Centre for Artificial‐Intelligence Nanophotonics, School of Optical‐Electrical and Computer Engineering University of Shanghai for Science and Technology Shanghai China

3. School of Optical‐Electrical and Computer Engineering University of Shanghai for Science and Technology Shanghai China

Funder

China Postdoctoral Science Foundation

Science and Technology Commission of Shanghai Municipality

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.13083

Reference28 articles.

1. Adaptive optical microscopy: the ongoing quest for a perfect image

2. Adaptive optics via pupil segmentation for high-resolution imaging in biological tissues

3. Comparison of closed loop and sensorless adaptive optics in widefield optical microscopy

4. Adaptive optics confocal microscopy using direct wavefront sensing

5. Shack-Hartmann wavefront-sensor-based adaptive optics system for multiphoton microscopy

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