A Novel Tensile Device for In Situ Scanning Electron Microscope Mechanical Testing-Reference-Cited by-同舟云学术

A Novel Tensile Device for In Situ Scanning Electron Microscope Mechanical Testing

Published:2012-11-01 Issue:6 Volume:39 Page:3-11
ISSN:0732-8818
Container-title:Experimental Techniques
language:en
Short-container-title:

Author:

Ma Z.¹,Zhao H.¹,Huang H.¹,Zhang L.¹,Wang K.¹,Zhou X.¹

Affiliation:

1. College of Mechanical Science & Engineering; Jilin University; Changchun China

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials

Reference20 articles.

1. “An In situ Tensile Tester for Studying Electrochemical Repassivation Behavior: Fabrication and Challenges,”;Neelakantan;Review of Scientiﬁc Instruments,2010

2. “In situ Observation of Strain Evolution in Cp-Ti Over Multiple Length Scales,”;Bettles;Physical Metallurgy and Materials Science,2011

3. “An Off-chip Actuated Tensile Test Device for Microscale Mechanical Testing,”;Zhang;Chinese Journal of Mechanical Engineering,2009

4. “An Automatic Tensile Test Measurement System for Miniature Specimens,”;Hou;Experimental Techniques,2005

5. “A Tensile Test Device for In situ Atomic Force Microscope Mechanical Testing,”;Bamberg;Precision Engineering,2006

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