Super-aperture metrology: overcoming a fundamental limit in imaging smooth highly curved surfaces-Reference-Cited by-同舟云学术

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Super-aperture metrology: overcoming a fundamental limit in imaging smooth highly curved surfaces

Published:2015-11-12 Issue:3 Volume:261 Page:300-306
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

LIU J.¹,LIU C.¹,TAN J.¹,YANG B.²,WILSON T.¹³

Affiliation:

1. Center of Ultra-Precision Optoelectronic Instrument Engineering; Harbin Institute of Technology; No. 92 West Da-Zhi Street Harbin 150001 China

2. School of Science; Harbin Institute of Technology; No. 92, West Da-Zhi Street Harbin 150001 China

3. Department of Engineering Science; University of Oxford; Parks Road Oxford OX1 3PJ U.K

Funder

National Nature and Science Foundation Committee

Ministry of Science and Technology

Defense Fundamental Researches

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12334/fullpdf

Reference30 articles.

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2. Interferometric determination of the topographies of absolute sphere radii using the sphere interferometer of PTB;Bartl;Meas. Sci. Technol.,2010

3. Reconstruction of scalar and vectorial components in X-ray dark-field tomography;Bayer;Proc. Natl. Acad. Sci.,2014

4. Reaction-based fluorescent sensor for investigating mobile Zn2+ in mitochondria of healthy versus cancerous prostate cells;Chyan;Proc. Natl. Acad. Sci.,2014

5. Characterizing the shape of freeform optics;Forbes;Opt. Express,2012

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