Improving EBSD precision by orientation refinement with full pattern matching-Reference-Cited by-同舟云学术

Improving EBSD precision by orientation refinement with full pattern matching

Published:2020-02 Issue:2 Volume:277 Page:79-92
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

WINKELMANN A.¹²^ORCID,JABLON B.M.²³,TONG V.S.³^ORCID,TRAGER‐COWAN C.²^ORCID,MINGARD K.P.³

Affiliation:

1. Academic Centre for Materials and NanotechnologyAGH University of Science and Technology Krakow Poland

2. Department of Physics, SUPAUniversity of Strathclyde Glasgow U.K.

3. National Physical Laboratory Teddington Middlesex U.K.

Funder

Department for Business, Energy and Industrial Strategy, UK Government

Engineering and Physical Sciences Research Council

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.12870

Reference45 articles.

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2. High angular resolution electron backscatter diffraction: measurement of strain in functional and structural materials;Britton T.B.;Microsc. Anal.,2013

3. Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns

4. Rapid misfit dislocation characterization in heteroepitaxial III-V/Si thin films by electron channeling contrast imaging

5. Bilateral filter based orientation smoothing of EBSD data

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