Functional mapping of N deficiency‐induced response in wheat yield‐component traits by implementing high‐throughput phenotyping-Reference-Cited by-同舟云学术

Functional mapping of N deficiency‐induced response in wheat yield‐component traits by implementing high‐throughput phenotyping

Published:2019-01-30 Issue:6 Volume:97 Page:1105-1119
ISSN:0960-7412
Container-title:The Plant Journal
language:en
Short-container-title:Plant J

Author:

Jiang Libo¹,Sun Lidan²,Ye Meixia¹,Wang Jing¹,Wang Yaqun³,Bogard Matthieu⁴,Lacaze Xavier⁴,Fournier Antoine⁴,Beauchêne Katia⁴,Gouache David⁴,Wu Rongling¹⁵^ORCID

Affiliation:

1. Center for Computational Biology College of Biological Sciences and Technology Beijing Forestry University Beijing 100083 China

2. Beijing Key Laboratory of Ornamental Plants Germplasm Innovation and Molecular Breeding National Engineering Research Center for Floriculture College of Landscape Architecture Beijing Forestry University Beijing 100083 China

3. Department of Biostatistics Rutgers University New Brunswick NJ 08901 USA

4. Arvalis Institut du Végétal 3‐5 Rue Joseph et Marie Hackin 75116 Paris France

5. Center for Statistical Genetics Departments of Public Health Sciences and Statistics Pennsylvania State University Hershey PA 17033 USA

Funder

National Natural Science Foundation of China

Agence Nationale de la Recherche

Publisher

Wiley

Subject

Cell Biology,Plant Science,Genetics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/tpj.14186