Rapid aberration measurement with pixelated detectors-Reference-Cited by-同舟云学术

Rapid aberration measurement with pixelated detectors

Author:

LUPINI A.R.¹²,CHI M.³,JESSE S.³²

Affiliation:

1. Materials Science & Technology Division; Oak Ridge National Laboratory; Oak Ridge Tennessee U.S.A.

2. Institute for Functional Imaging of Materials; Oak Ridge National Laboratory; Oak Ridge Tennessee U.S.A.

3. Center for Nanophase Materials Sciences; Oak Ridge National Laboratory; Oak Ridge Tennessee U.S.A.

Funder

Materials Sciences and Engineering Division, Basic Energy Sciences, Office of Science, U.S. Department of Energy (A.R.L.)

Oak Ridge National Laboratory's Center for Nanophase Materials Sciences

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

Reference28 articles.

3. Measurement of electron-optical parameters for high-resolution electron microscopy image interpretation;Jong;Scanning Microscopy Supplement,1992

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