X-ray photoelectron spectroscopy analysis of Ge-Sb-Se pulsed laser deposited thin films-Reference-Cited by-同舟云学术

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X-ray photoelectron spectroscopy analysis of Ge-Sb-Se pulsed laser deposited thin films

Published:2018-03-09 Issue:8 Volume:101 Page:3347-3356
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J Am Ceram Soc

Author:

Baudet Emeline¹,Cardinaud Christophe²,Boidin Rémi¹,Girard Aurélie²,Gutwirth Jan¹,Němec Petr¹,Nazabal Virginie¹³^ORCID

Affiliation:

1. Department of Graphic Arts and Photophysics; Faculty of Chemical Technology; University of Pardubice; Pardubice Czech Republic

2. Institut des Matériaux Jean Rouxel (IMN) UMR 6502; Université de Nantes; CNRS; Nantes Cedex France

3. Institut des Sciences Chimiques de Rennes; UMR-CNRS 6226; Equipe Verres et Céramiques; Université de Rennes 1; Rennes France

Funder

Grantová Agentura České Republiky

Czech Ministry of Education, Youth and Sports of the Czech Republic

French Ministry of Education and Research

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jace.15512/fullpdf

Reference37 articles.

1. Glasses for seeing beyond visible;Zhang;Chemistry,2008

2. Waveguides based on Te2As3Se5 thick films for spatial interferometry;Vigreux-Bercovici;J Non-Cryst Solids,2006

3. As2S3 photosensitivity by two-photon absorption: holographic gratings and self-written channel waveguides;Meneghini;J Opt Soc Am,1998

4. Photoinduced effects and metastability in amorphous semiconductors and insulators;Shimakawa;Adv Phys,1995

5. Photo-stability of pulsed laser deposited GexAsySe100-x-y amorphous thin films;Nemec;Opt Express,2010

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