Epifluorescence microscopy study of a quadruple node of triple junctions of grain boundaries in a Eu2+‐decorated highly textured composite of (Cl, Br)(K, Rb) and I(K, Rb) solid solutions

Abstract

AbstractThe structural nature and geometry, as well as the lattice‐relative orientation, of an arrangement of crystal defects in a highly textured Eu2+‐doped composite of two alkali‐halide solid solutions was studied by epifluorescence microscopy (EFM) using the doping ion as a fluorochrome. A three‐dimensional reconstruction and a skeleton type model, as built from a sequence of EFM images of different optical cross‐sections of this arrangement, are presented. Structurally, this arrangement is a quadruple node (QN) of triple junctions of grain boundaries. The QN core geometry is that of a tetragonal tristetrahedron (TTTH), centred at the QN site, whose tetrahedron vertices and edges are on the QN triple junctions and grain boundaries, respectively, whereas the tristetrahedron tetragonal axis is nearly parallel to the lattice [001]‐axis. The measured values of the angles between triple junctions and between the grain boundaries forming them are reported. The distinct chemical compositions of the composite solid solutions are discussed to be responsible, in last instance, for the tristetrahedron departure from a cubic configuration. Collaterally, certain families of translationally periodic almost‐parallel (TPAP)‐wall‐like regions which consist of TPAP‐columns of TPAP‐spindle‐like singularities, as well as certain zigzag arrays of columns of this like, existing into the QN grains, are reported to be observed. Three‐dimensional reconstructions of typical individuals of these families and arrays as well as of their constituent parts are presented and geometrically analysed. These families and arrays are discussed to be families of tilt subboundaries, whose constituent dislocations are decorated by cylindrical second‐phase europium di‐halide precipitates, and regularly faceted tilt subboundaries, respectively. Crystal growing and sample preparation, composite structural characterisation by powder and single‐slab X‐ray diffraction (PXRD and SSXRD, respectively), microscopy and fluorescence‐cube unit optics, image processing, electronic three‐dimensional reconstruction and measuring methodologies, are all described in detail.