Dielectric Dispersion of Polycrystalline Aluminum Nitride at Microwave Frequencies-Reference-Cited by-同舟云学术

Dielectric Dispersion of Polycrystalline Aluminum Nitride at Microwave Frequencies

Published:1996-06 Issue:6 Volume:79 Page:1453-1456
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J American Ceramic Society

Author:

Nakayama Akira,Nambu Shinji,Inagaki Masahiro,Miyauchi Masahiko,Itoh Nobuyuki

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1151-2916.1996.tb08749.x/fullpdf

Reference14 articles.

1. The dielectric properties of aluminium nitride substrates for microelectronics packaging

2. 2H. Farzanehfard, and A. Elshabini-Riad , "Wideband Characterization of Aluminum Nitride (AlN) Substrates and High-Frequency Application on These Substrate," Conference on Precision Electromagnetic Measurements, 218 -19 (1990 ).

3. Dielectric behaviour of hot pressed AlN ceramic exposed to inorganic acid vapours

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