Microstructure Development in RuO2-Glass Thick-Film Resistors and Its Effect on the Electrical Resistivity-Reference-Cited by-同舟云学术

Microstructure Development in RuO2-Glass Thick-Film Resistors and Its Effect on the Electrical Resistivity

Published:1990-07 Issue:7 Volume:73 Page:1953-1957
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J American Ceramic Society

Author:

Yamaguchi Takashi,Iizuka Kazuhiko

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1151-2916.1990.tb05251.x/fullpdf

Reference9 articles.

1. 1C. A. Schaffer, and T. E. Sergent , "The Effect of Particle Size Distribution on the Electric Properties of RuO2Thick-Film Resistors ,"Proc. ISHM Symp., pp. 60 64 (1977 ).

2. Conductive and Insulative Particle Size Effects on the Electrical Properties of RuO<inf>2</inf>Thick-Film Resistors

3. The Microstructure of RuO<inf>2</inf>Thick Film Resistors and the Influence of Glass Particle Size on their Electrical Properties

4. Kinetics of Liquid Spreading and Penetration with Application to RuO2-Glass Thick-Film Resistors

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