Scanning Electron-Beam Dielectric Microscopy for the Investigation of the Temperature Coefficient Distribution of Dielectric Ceramics-Reference-Cited by-同舟云学术

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Scanning Electron-Beam Dielectric Microscopy for the Investigation of the Temperature Coefficient Distribution of Dielectric Ceramics

Published:2004-12-21 Issue:5 Volume:83 Page:1299-1301
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:

Author:

Cho Yasuo,Jintsugawa Osamu,Yamanouchi Kazuhiko

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1151-2916.2000.tb01375.x/fullpdf

Reference7 articles.

1. Determination of the Temperature Coefficient Distribution of Dielectric Ceramics Using Scanning Photothermal Dielectric Microscopy;Cho;J. Am. Ceram. Soc.,1999

2. Photothermal Dielectric Spectroscopic Microscope;Cho;Rev. Sci. Instrum.,1996

3. Photothermal Dielectric Effect with Liquid;Cho;Jpn. J. Appl. Phys.,1996

4. Observation of Photothermal Dielectric Signal for Powder;Cho;Jpn. J. Appl. Phys.,1997

5. Microwave Dielectric Properties of (Ba,Sr)O-Sm2O3-TiO2 Ceramics;Nishigaki;Am. Ceram. Soc. Bull.,1987

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Scanning nonlinear dielectric microscopy;Advances in Imaging and Electron Physics;2003

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