First Symposium for Reliability in Multilayer Ceramic Capacitors-Reference-Cited by-同舟云学术

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First Symposium for Reliability in Multilayer Ceramic Capacitors

Published:1989-12 Issue:12 Volume:72 Page:2221-2222
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J American Ceramic Society

Author:

Dayton Gordon O.

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1151-2916.1989.tb06065.x/fullpdf

Reference15 articles.

1. 1S. K. Kurtz , "Introduction to Semiconductor Reliability, Principles, and Practice of Semiconductor Reliability for Electrical Engineers", The Pennsylvania State University, College of Engineering, Course No. EE597K, Spring, 1989 .

2. NEW DIRECTIONS FOR RELIABILITY

3. 4D. S. Peck, and O. D. Trapp , Accelerated Testing Handbook . Technology Associates, 1987 .

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of Electroless Nickel Plating on Multilayer Ceramic Capacitors and the Implications for Reliability in Multilayer Ceramic Capacitors;Journal of the American Ceramic Society;2005-01-21

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