Electromechanical Resonances in Ceramic Capacitors and Their Use for Rapid Nondestructive Testing-Reference-Cited by-同舟云学术

Electromechanical Resonances in Ceramic Capacitors and Their Use for Rapid Nondestructive Testing

Published:1989-12 Issue:12 Volume:72 Page:2282-2286
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J American Ceramic Society

Author:

Boser Otmar,Kellawon Paulette,Geyer Richard

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1151-2916.1989.tb06075.x/fullpdf

Reference15 articles.

1. 2C. L. Vorres, D. E. Yuhas, and L. W. Kessler , "Non-Destructive Evaluation of Ceramic Chip Capacitors by Means of the Scanning Laser Acoustic Microscope" ; pp.F3-1 F3-6 inProceedings of the Second Capacitor and Resistor Technology Symposium. Components Technology Institute, Huntsville, AL, 1982 .

2. Acoustic Emission Testing of Multilayer Ceramic Capacitors

3. 5O. Boser , "Nondestructive Testing of Multilayer Ceramic Capacitors" , U.S. Patent No. 4 644 259, Feb. 1987 .

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