Calculation of XANES/ELNES Spectra of All Edges in Si3N4 and Si2N2O
Author:
Publisher
Wiley
Subject
Materials Chemistry,Ceramics and Composites
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1151-2916.2002.tb00030.x/fullpdf
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3. Electron Energy-Loss Near-Edge Structure of Internal Interfaces by Spatial Difference Spectroscopy,;Müllejans;J. Microsc. (Oxford),1995
4. A Quantitative Approach for Spatially-Resolved Electron Energy-Loss Spectroscopy of Grain Boundaries and Planar Defects on a Subnanometer Scale;Gu;Ultramicroscopy,1995
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