Comparing Xe + pFIB and Ga + FIB for TEM sample preparation of Al alloys: Minimising FIB‐induced artefacts-Reference-Cited by-同舟云学术

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Comparing Xe + pFIB and Ga + FIB for TEM sample preparation of Al alloys: Minimising FIB‐induced artefacts

Published:2020-12-24 Issue:2 Volume:282 Page:101-112
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

Zhong Xiangli¹^ORCID,Wade C. Austin²,Withers Philip J.³,Zhou Xiaorong¹,Cai Changrun¹,Haigh Sarah J.¹^ORCID,Burke M. Grace²

Affiliation:

1. Department of Materials University of Manchester Manchester UK

2. Department of Materials, Materials Performance Centre University of Manchester Manchester UK

3. Department of Materials, Henry Royce Institute University of Manchester Manchester UK

Funder

Engineering and Physical Sciences Research Council

H2020 European Research Council

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.12983

Reference57 articles.

1. Focused ion beam sample preparation of continuous fibre-reinforced ceramic composite specimens for transmission electron microscopy

2. TEM Sample Preparation and FIB-Induced Damage

3. FIB damage of Cu and possible consequences for miniaturized mechanical tests

4. Molecular dynamic simulation of low-energy FIB irradiation induced damage in diamond

5. FIB-induced damage in silicon

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