Laser ablation of Ga‐Sb‐Te thin films monitored with quadrupole ion trap time‐of‐flight mass spectrometry-Reference-Cited by-同舟云学术

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Laser ablation of Ga‐Sb‐Te thin films monitored with quadrupole ion trap time‐of‐flight mass spectrometry

Published:2021-07-23 Issue:12 Volume:104 Page:6643-6652
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J Am Ceram Soc.

Author:

Mandal Govinda¹,Gorylová Magdaléna²,Nazabal Virginie²³,Němec Petr²^ORCID,Havel Josef¹^ORCID

Affiliation:

1. Department of Chemistry Faculty of Science Masaryk University Brno Czech Republic

2. Department of Graphic Arts and Photophysics Faculty of Chemical Technology University of Pardubice Pardubice Czech Republic

3. Univ RennesCNRSISCR UMR6226ScanMAT UMS 2001 Rennes France

Funder

Grantová Agentura České Republiky

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/jace.18021

Reference35 articles.

1. Phase Change Materials and Their Application to Nonvolatile Memories

2. Design Rules for Phase-Change Materials in Data Storage Applications

3. Microscopic Complexity in Phase-Change Materials and its Role for Applications

4. Designing crystallization in phase-change materials for universal memory and neuro-inspired computing

5. Recent developments in phase change materials for energy storage applications: A review

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