Fast Force Control without Force Sensor Using Combination of aaKF and RFOB for In-circuit Test with Probing System-Reference-Cited by-同舟云学术

Fast Force Control without Force Sensor Using Combination of aaKF and RFOB for In-circuit Test with Probing System

Published:2019-03-01 Issue:2 Volume:8 Page:152-159
ISSN:2187-1094
Container-title:IEEJ Journal of Industry Applications
language:en
Short-container-title:IEEJ Journal IA

Author:

Nagai Sakahisa¹,Oboe Roberto²,Shimono Tomoyuki¹³,Kawamura Atsuo¹³

Affiliation:

1. Division of Electrical and Computer Engineering, Yokohama National University

2. Department of Management and Engineering, University of Padova, Stradella San Nicola

3. Kanagawa Institute of Industrial Science and Technology

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Mechanical Engineering,Energy Engineering and Power Technology,Automotive Engineering

Link

https://www.jstage.jst.go.jp/article/ieejjia/8/2/8_152/_pdf

Reference14 articles.

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2. (2) Q. Yuan, L. Han, J. Li, and D. Ge: “Real-time voltage and resistance features in microprobe testing process”, IEEE Trans. Components, Packaging and Manufacturing Technology, Vol. 5, No. 2, pp. 274-278 (2015)

3. (3) Y. Hiratsuka, F. Katoh, K. Konishi, and S. Shin: “A design method for minimum cost path of flying probe in-circuit testers”, In Proc. of SICE Annual Conference 2010, pp. 2933-2936 (2010)

4. (4) J. H. Shim, H. S. Cho, and S. Kim: “An actively compliable probing system”, IEEE Control Systems, Vol. 17, No. 1, pp. 14-21 (1997)

5. (5) N. Shimada, T. Yoshioka, K. Ohishi, and T. Miyazaki: “Novel force-sensorless contact motion control for quick and smooth industrial robot motion”, In Proc. of the 37th Annual Conference on IEEE Industrial Electronics Society, IECON2011, pp. 4238-4243 (2011)

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