New Induction Heating Coils with Reduced Iron-Loss in the Cores for Small-Foreign-Metal Particle Detector Using an SiC-MOSFETs High-Frequency Inverter

Author:

Shijo Takuya1,Uchino Yuki1,Noda Yujiro1,Yamada Hiroaki1,Tanaka Toshihiko1

Affiliation:

1. Department of Electrical and Electronic Engineering, Yamaguchi University

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Mechanical Engineering,Energy Engineering and Power Technology,Automotive Engineering

Reference13 articles.

1. (1) D. Capozzo, S. Fleming, B. Foley, and M. Macri: “Lithium ion battery safety”, Worcester Polytechnic Institute, pp. 1-169 (2006)

2. (2) M. Arakawa and M. Ichimura: “Latest safety test technologies of lithium-ion batteries and construction of battery safety evaluation site”, NTT Facilities Research Institute, Annual Report No. 20, pp. 1-7 (2009)

3. (3) M. Ikeda, A. Mase, and K. Uchino: “Small-conductive-particle detection with a microwave resonant cavity”, IEEJ Trans. on Ind. Appl., Vol. 132, No. 8, pp. 788-793 (2011)

4. (4) T. Nakai, Y. Miura, and K. Ishiyama: “Method of detection a small magnetic particle by using a sensitive thin-film sensor with application of strong magnetic field in the substrates normal direction”, IEEJ Annu. Meet., p. 137 (2013)

5. (5) S. Tanaka, T. Akai, and Y. Kitamura: “Two-channel HTS SQUID gradiometer system for detection metallic contaminants in lithium-ion battery”, IEEE Transactions on Applied Superconductivity, Vol. 21, No. 3, pp. 424-427 (2011)

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