Discussion of Discriminating Multiple Sources of SEF Overlapping in Time using SVD Method-Reference-Cited by-同舟云学术

Discussion of Discriminating Multiple Sources of SEF Overlapping in Time using SVD Method

Published:2003 Issue:8 Volume:123 Page:804-812
ISSN:0385-4205
Container-title:IEEJ Transactions on Fundamentals and Materials
language:en
Short-container-title:IEEJ Trans. FM

Author:

Kim Bong-Soo¹,Uchikawa Yoshinori¹

Affiliation:

1. Applied Systems Engineering, Graduate School of Science and Engineering, Tokyo Denki University

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering

Link

https://www.jstage.jst.go.jp/article/ieejfms/123/8/123_8_804/_pdf

Reference18 articles.

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3. (3) J. Maiyer, G. Dagnelie, H. Spekereijse, and B. Van Dijk : “Principal components analysis for source localization of VEPs in man”, Vision Res., Vol. 27, pp. 165-177 (1987)

4. (4) J. C. Mosher, P. S. Lewis, and R. M. Leahy : “Multiple dipole modeling and localization from spatio-temporal MEG data”, IEEE Trans. Biomed. Eng., Vol. 39, pp. 541-557 (1992)

5. (5) H. Kudo, T. Maeda, and T. Saito : “Signal source localization from spatio-temporal biomagnetic data by signal subspace method”, T. IEICE Japan, Vol. J78-D-II, No. 3, pp. 559-570, (1995-3) (in Japanese)

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