Measurement of Transient Electric-fields Emitted from Micro-gap ESD in Spherical Electrodes by using Optical Electric-field Sensor

Author:

Ishigami Shinobu1,Kawamata Ken1,Minegishi Shigeki1,Fujiwara Osamu2

Affiliation:

1. Tohoku Gakuin University

2. University of Electro-Communications

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering

Reference17 articles.

1. (1) For example, T. Takagi : “Research and Development on EMC/EMI Measurement and Technologies in Japan”, Trans. IEICE, Vol. J79-B-II, No. 11, pp. 718-726 (1996-11) (in Japanese)

2. (3) O. Fujiwara : “A source model for explaining ESD event and field properties”, J. IEICE, Vol. 78, No. 9, pp. 851-852 (1995-9) (in Japanese)

3. (5) M. Masugi, K. Murakami, N. Kuwabara, and F. Amemiya : “Measurement and Analysis of Electromagnetic Pulses due to Indirect ESD”, IEICE Trans. Commun., Vol. J75-B-II, No. 9, pp. 647-654 (1992-9) (in Japanese)

4. (6) S. Ishigami, I. Yokoshima, R. Gokita, and Y. Nishiyama : “Measurements of Fast Transient Magnetic Fields Radiated by Short Gap Discharges”, Technical Report of IEICE, EMCJ93-43, pp. 13-18 (1993) (in Japanese)

5. (7) K. Kawamata, S. Minegishi, and O. Fujiwara : “Radiation Characteristics of Impulsive Electromagnetic Wave Caused by ESD in Spherical Electrode”, J. Inst. Electrostat. Jpn., Vol. 39, No. 2, pp. 54-59 (2015) (in Japanese)

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