Low Energy Electron Beam Induced Charging and Secondary Electron Emission Properties of FEP Film Used on Satellite Surfaces-Reference-Cited by-同舟云学术

Low Energy Electron Beam Induced Charging and Secondary Electron Emission Properties of FEP Film Used on Satellite Surfaces

Published:2012 Issue:9 Volume:132 Page:790-796
ISSN:0385-4205
Container-title:IEEJ Transactions on Fundamentals and Materials
language:en
Short-container-title:IEEJ Trans. FM

Author:

Fujii Haruhisa¹,Okumura Teppei²,Takahashi Masato²

Affiliation:

1. Department of Electrical Engineering, Nara National College of Technology

2. Japan Aerospace Exploration Agency (JAXA)

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering

Link

https://www.jstage.jst.go.jp/article/ieejfms/132/9/132_790/_pdf

Reference15 articles.

1. (1) H. B. Garrett : “The charging of spacecraft surfaces”, Rev. Geophys., Vol. 19, pp. 577-616 (1981)

2. (2) M. Cho and H. Fujii : “Reviews on charging and discharging phenomena in space environment, I. Space environment and spacecraft charging”, Aeronautical & Space Sci. Jpn, Vol. 51, No. 591, pp. 109-117 (2003) (in Japanese)

3. (3) C. K. Purvis, N. J. Stevens, and J. C. Oglebay : “Charging characteristics of materials: Comparison of experimental results with simple analytical models”, Proc. Spacecraft Charging Technology Conference, NASA-TMX-73537, pp. 459-486 (1977)

4. (4) H. Fujii, Y. Shibuya, T. Abe, and R. Kasai : “Electrostatic charging and arc discharges on satellite dielectrics simulated by electron beam”, J. Spacecrafts & Rockets, Vol. 25, pp. 156-161 (1988)

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