Application of Optical Diagnosis to Aged Low-Voltage Cable Insulation in Nuclear Plants
Author:
Affiliation:
1. Hitachi Research Labs. Hitachi, Ltd.
2. Hitachi-GE Nuclear Energy, Ltd.
Publisher
Institute of Electrical Engineers of Japan (IEE Japan)
Subject
Electrical and Electronic Engineering
Link
http://www.jstage.jst.go.jp/article/ieejfms/128/6/128_6_421/_pdf
Reference16 articles.
1. (1) T. Ikeda, T. Ashida, and K. Kawasaki : “Development of the ultrasonic degradation tester for voltage cables”, T. IEE Japan, Vol. 120-B, No. 11, pp. 1437-1442 (2000-11) (in Japanese)
2. 池田 毅.芦田哲哉.川崎勝利:「低圧ケーブル用超音波劣化診断器の開発」,電学論B, 120, 11, pp. 1437-1442 (2000-11)
3. Nuclear technology and ageing
4. (3) W. Schnabel(相馬純吉 訳):高分子の劣化,裳華房 (1993)
5. (4) H. Shoji, J. Katagiri, Y. Takezawa, K. Ootaka, and C. Takeuchi : “Application of Optical Diagnosis to aged Low-voltage Cable Insulation”, International Conference on Wire System Aging, pp. 221-231, Rockville, Maryland (2002)
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