Noise Monitoring Method Inside IC using Full-digital Circuits under Actual Environment-Reference-Cited by-同舟云学术

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Noise Monitoring Method Inside IC using Full-digital Circuits under Actual Environment

Published:2018-06-01 Issue:6 Volume:138 Page:335-340
ISSN:0385-4205
Container-title:IEEJ Transactions on Fundamentals and Materials
language:en
Short-container-title:IEEJ Trans. FM

Author:

Fujimoto Daisuke¹,Hayashi Yu-ichi¹

Affiliation:

1. Nara Institute of Sicence and Technology

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering

Link

https://www.jstage.jst.go.jp/article/ieejfms/138/6/138_335/_pdf

Reference11 articles.

1. (1) C. R. Paul : Introduction to Electromagnetic Compatibility, Wiley Series in Microwave and Optical Engineering, Wiley-Interscience (2006)

2. (2) H. W. Ott : Electromagnetic Compatibility Engineering, Wiley (2009)

3. (3) S. M. Sandler : Power Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems, McGraw-Hill Education (2014)

4. (4) Federal Communications Commission : FCC Part 15 Subpart B

5. (5) CISPR : CISPR 22 Radiated and Conducted EMI Limits

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