Analysis of Near Field Noise Voltage Caused by Pulse Current on Power Electronics Circuits-Reference-Cited by-同舟云学术

Analysis of Near Field Noise Voltage Caused by Pulse Current on Power Electronics Circuits

Published:2009 Issue:9 Volume:129 Page:859-865
ISSN:0913-6339
Container-title:IEEJ Transactions on Industry Applications
language:en
Short-container-title:IEEJ Trans. IA

Author:

Ariga Zen-nosuke¹,Wada Keiji¹

Affiliation:

1. Tokyo Metropolitan University

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering

Link

http://www.jstage.jst.go.jp/article/ieejias/129/9/129_9_859/_pdf

Reference30 articles.

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2. (2) J. W. Kolar, U. Drofenik, J. Biela, M. Heldwein, H. Ertl, T. Friedli, and S. Round: “PWM Converter Power Density Barriers”, IEEJ/IAS Trans., Vol. 128, No. 4, pp. 468-480 (2008)

3. (3) S. Ogasawara, H. Fujita, and H. Akagi: “Modeling and Analysis of High-Frequency Leakage Currents Caused by Voltage-Source PWM Inverters”, IEEJ/IAS Trans., Vol. 115, No. 1, pp. 77-83 (1995-1) (in Japanese)

4. 小笠原悟司.藤田英明.赤木泰文: 「電圧形PWMインバータが発生する高周波漏れ電流のモデリングと理論解析」, 電学論D, 115, 1, pp. 77-83 (1995-1)

5. (4) 半導体電力変換器の電磁波障害協同研究委員会編: 「パワーエレクトロニクス機器の電磁波ノイズ」, 電学技報, 第545号 (1995)

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