Experimental Verification and Loss Analysis of MHz-operating Discontinuous Current-mode Grid-tied Inverter using GaN-HEMT Device-Reference-Cited by-同舟云学术

Experimental Verification and Loss Analysis of MHz-operating Discontinuous Current-mode Grid-tied Inverter using GaN-HEMT Device

Published:2019-03-01 Issue:3 Volume:139 Page:249-257
ISSN:0913-6339
Container-title:IEEJ Transactions on Industry Applications
language:en
Short-container-title:IEEJ Trans. IA

Author:

Yamanodera Daichi¹,Iijima Ryuji¹,Isobe Takanori¹,Tadano Hiroshi¹

Affiliation:

1. Department of Pure and Applied Sciences, University of Tsukuba

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering

Link

https://www.jstage.jst.go.jp/article/ieejias/139/3/139_249/_pdf

Reference22 articles.

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3. (3) X. Huang, Z. Liu, Q. Li, and F. C. Lee: “Evaluation and Application of 600V GaN HEMT in Cascode Structure”, IEEE Tranactions on Power Electronics, Vol. 29, No. 5, pp. 2453-2461 (2014)

4. (4) S. G. Jeong and M. H. Park: “The analysis and compensation of dead-time effects in PWM inverters”, IEEE Trans. Industrial Electronics, Vol. 38, No. 2, pp. 108-114 (1991)

5. (5) M. Ogawa, S. Ogasawara, and M. Takemoto: “A Feedback-Type Dead-Time Compensation Method for High-Frequency PWM Inverters with Low Distortion and High Voltage Utilization Factor Characteristics”, T. IEE Japan, Vol. 133D, No. 10, pp. 970-977 (2013) (in Japanese)