Modeling Method of Conducted Noise on AC/DC Converter using SiC Devices

Author:

Kawamura Yuki1,Tanaka Hidetoshi1,Kitagawa Wataru1,Takeshita Takaharu1

Affiliation:

1. Nagoya Institute of Technology

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering

Reference11 articles.

1. (1) H. Komatsu and T. Noguchi: “Development of Drive Circuits for Super High-Speed Switching Devices to Reduce High-Frequency EMI Noise”, The papers of Technical Meeting on Semiconductor Power Converter, IEE Japan, Vol. SPC-07, No. 11-20, pp. 43-48 (2007)

2. (2) H. Tanaka, K. Suzuki, W. Kitagawa, and T. Takeshita: “Conducted Noise Reduction on AC/DC Converter using SiC-MOSFET”, Renewable Energy Research and Applications (ICRERA), 2016 IEEE International Conference on (2016)

3. (3) H. Tanaka, K. Suzuki, W. Kitagawa, and T. Takeshita: “Design for Conducted Noise Reduction on AC/DC Converter using SiC-MOSFET”, Electrical Machines and Systems (ICEMS), 2016 19th International Conference on (2016)

4. (4) P. Bogónez-Franco and J. B. Sendra: “EMI comparison between Si and SiC technology in a boost converter”, Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on (2012)

5. (5) T. Kim, D. Feng, M. Jang, and V. Agelidis: “Common Mode Noise Analysis for Cascaded Boost Converter with Silicon Carbide Devices”, IEEE Trans. on Power Electronics, Vol. PP, No. 99 (2016)

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