Method for Evaluating Insertion Loss of EMI Filter Connected to Semiconductor Power Converters-Reference-Cited by-同舟云学术

Method for Evaluating Insertion Loss of EMI Filter Connected to Semiconductor Power Converters

Published:2012 Issue:7 Volume:132 Page:727-735
ISSN:0913-6339
Container-title:IEEJ Transactions on Industry Applications
language:en
Short-container-title:IEEJ Trans. IA

Author:

Tamate Michio¹,Sasaki Tamiko¹,Toba Akio¹,Matsumoto Yasushi¹,Wada Keiji²,Shimizu Toshihisa²

Affiliation:

1. Fuji Electric Co., Ltd.

2. Tokyo Metropolitan University

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering

Link

https://www.jstage.jst.go.jp/article/ieejias/132/7/132_727/_pdf

Reference19 articles.

1. (2) M. Kanda, N. Oka, and S. Nitta: “Common Mode Impedance Model of Power Electronic Equipment to Evaluate Noise Reduction Effect of a Line Noise Filter”, 2000 IEEE International Symposium on EMC, pp. 65-70 (2000)

2. (3) S. Wang, F. C. Lee, and W. G. Odendaal: “Using Scattering Parameters to Characterize EMI filters”, PESC'04, pp. 297-303 (2004)

3. A procedure for designing EMI filters for AC line applications

4. (5) T. Kato, S. Lee, and K. Takeya: “Modeling of a Power Electronic Converter for EMC in the Conduction Emission Frequency Band”, T. IEE Japan, Vol. 120-C, No. 11, pp. 1555-1560 (2000-11) (in Japanese)

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