Flashover-characteristics in the Micrometer-scale Gap on ZnO

Author:

Tani Naoki1,Okada Sho1,Ueno Hideki1

Affiliation:

1. Graduate School of Engineering, University of Hyogo

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering

Reference20 articles.

1. (2) G. E. Moore : “Cramming More Components onto Integrated Circuits”, Proc. IEEE, Vol. 86, No. 1, pp. 82-85 (1998)

2. (3) M. Nambata and T. Yoshida : “Electrical Stress Induced on Wearable Devices by Electrostatic Discharge from a Charged Human Body to a Grounded Conductor”, J. Electrostat., Vol. 40, No. 6, pp. 295-301 (2016) (in Japanese)

3. (6) D. B. Go and D. A. Pohlman : “A mathematical model of the modified Paschen's curve for breakdown in microscale gaps”, J. Appl. Phys., 107, 103303 (2010)

4. (7) Y. Yamano : “Characterisitics of Breakdown between Electrodes with Micro-gap in Atomosphere”, J. Inst. Electrostat. Jpn., Vol. 36, No. 3, pp. 146-151 (2012) (in Japanese)

5. (10) H. Nakayama, M. Onoda, and K. Amakawa : “Breakdown Characteristics of Small Air Gap with Ceramics Composite Electrodes”, IEEJ Trans. FM, Vol. 115, No. 9, pp. 839-844 (1995) (in Japanese)

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