Generation of Dark Hole using an Annular Spiral Phase Plate and an Annular Wave Plate
Author:
Affiliation:
1. NTT Advanced Technology Corporation
2. Kitasato University
Publisher
Institute of Electrical Engineers of Japan (IEE Japan)
Link
https://www.jstage.jst.go.jp/article/ieejeiss/144/4/144_326/_pdf
Reference5 articles.
1. (1) S. W. Hell and J. Wichmann : “Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy”, Opt. Lett., Vol. 19, No. 11, pp. 780-782 (1994)
2. (2) Y. Iketaki, T. Omatsu, O. Sato, T. Suzuki, and M. Fujii : “Super-resolution fluorescence microscopy by upconversion-depletion using two color lasers”, Trends in Optics and Photonics OSA Proceedings Series (TOPS), Vol. 39, pp. 167-168 (2000)
3. (3) M. G. L. Gustafsson : “Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy”, J. Microsc, Vol. 198, No. 2, pp. 82-87 (2000)
4. (4) Y. Iketaki : “Three-Dimensional Super-Resolution Microscope Using Two-Color Annular Phase Plate”, Appl. Phys. Express, Vol. 3, No. 8, 085203 (2010)
5. (5) K. Nagai, T. Maruyama, A. Kodaira, H. Kumagai, N. Bokor, and Y. Iketaki : “Evaluation of a combined two-color phase plate forming three-dimensional dark holes in super resolution microscopy”, Proc. SPIE 11245, 1124518 (2020)
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