FDTD Simulation of Transfer Impedance of Calibration Current Target for ESD Testing-Reference-Cited by-同舟云学术

FDTD Simulation of Transfer Impedance of Calibration Current Target for ESD Testing

Published:2011 Issue:3 Volume:131 Page:606-612
ISSN:0385-4221
Container-title:IEEJ Transactions on Electronics, Information and Systems
language:en
Short-container-title:IEEJ Trans.EIS

Author:

Gotoh Tsuyoshi¹,Taka Yoshinori¹,Mori Ikuko²,Fujiwara Osamu¹,Ishigami Shinobu³,Yamanaka Yukio³

Affiliation:

1. Graduate School of Engineering, Nagoya Institute of Technology

2. Department of Electronic and Information Engineering, Suzuka National College of Technology

3. National Institute of Information and Communications technology

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering

Link

https://www.jstage.jst.go.jp/article/ieejeiss/131/3/131_3_606/_pdf

Reference13 articles.

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2. (2) M. Honda : “EMI Aspects of the Metal-Metal ESD to the Electronic Equipment”, Journal of IEICE, Vol. 78, No. 9, pp. 849-852 (1995-9) (in Japanese)

3. (3) O. Fujiwara : “A Source Model for Explaining ESD Event and Field Properties”, Journal of IEICE, Vol. 78, No. 9, pp. 851-852 (1995-9) (in Japanese)

4. (4) R. Jobava, D. Pommerrenke, D. Karkashadze, P. Shubitidze, R. Zaridze, S. Frei, and M. Aidam : “Computer simulation of ESD from voluminous objects compared to transient field of humans”, IEEE Trans. EMC, Vol. 42, No. 1, pp. 54-65 (2000-2)

5. (5) P. Leuchtmann and J. Sroka : “Enhances field simulations and measurement of the ESD calibration setup”, Proc. 2001 IEEE EMC International Symposium, Montreal, Canada, pp. 1269-1272 (2001)

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