物体間相互損失を用いた選択的インスタンスセグメンテーション
Author:
Affiliation:
1. Faculty of Science and Technology, Meijo University
Publisher
Institute of Electrical Engineers of Japan (IEE Japan)
Subject
Electrical and Electronic Engineering
Link
https://www.jstage.jst.go.jp/article/ieejeiss/143/12/143_1106/_pdf
Reference18 articles.
1. (1) T. Okada, K. Inamura, and H. Wada : “What competitions were conducted in the service categories of the world robot summit”, Advanced Robotics, Vol. 33, Issue 17, pp. 900-910 (2019)
2. (2) J. Redmon, S. Divvala, R. Girshick, and A. Farhadi : “You Only Look Once: Unified, Real-Time Object Detection”, IEEE/CVF Conference on Computer Vision and Pattern Recognition (2016)
3. (3) L. Wei, A. Dragomir, E. Dumitru, S. Christian, R. Scott, F. Cheng-Yang, and B. Alexander : “SSD: Single Shot MultiBox Detector”, European Conference Computer Vision (2020)
4. (4) K. He, G. Gkioxari, P. Dollár, and R. Girshick : “Mask R-CNN”, IEEE/CVF International Conference on Computer Vision (2017)
5. (5) Z. Huang, L. Huang, Y. Gong, C. Huang, and X. Wang : “Mask Scoring R-CNN”, IEEE/CVF Conference on Computer Vision and Pattern Recognition (2019)
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