Ordered Search for Multiple Feature Patterns Based on Area Expansion by Union Operation and Confidential Interval-Reference-Cited by-同舟云学术

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Ordered Search for Multiple Feature Patterns Based on Area Expansion by Union Operation and Confidential Interval

Published:2022-08-01 Issue:8 Volume:142 Page:971-981
ISSN:0385-4221
Container-title:IEEJ Transactions on Electronics, Information and Systems
language:en
Short-container-title:IEEJ Trans.EIS

Author:

Asano Hirokazu¹,Takauji Hidenori²,Tanaka Takayuki³,Kaneko Shun'ichi³

Affiliation:

1. Kamakura Koki Co., Ltd.

2. Hokkai-Gakuen University

3. Hokkaido University

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering

Link

https://www.jstage.jst.go.jp/article/ieejeiss/142/8/142_971/_pdf

Reference30 articles.

1. (1) A Ishii : “Trends of Inspection and Shape Measurement Using Image Processing”, J. Jpn. Soc. Precis. Eng., Vol. 61, No. 5, pp. 603-604 (1995) (in Japanese)

2. 石井明：「画像応用検査・計測技術の展望」, 精密工学会誌, Vol. 61, No. 5, pp. 603-604 (1995)

3. (2) M. Hashimoto, M. Kurumisawa, and Y. Nakagawa : “Current Issue and Expectation of Machine Vision Application in Manufacturing Systems”, J. Jpn. Soc. Precis. Eng., Vol. 75, No. 2, pp. 224-227 (2009) (in Japanese)

4. 橋本学・楜沢信・中川泰夫：「生産システム分野における画像応用の現状と期待」, 精密工学会誌, Vol. 75, No. 2, pp. 224-227 (2009)

5. (3) H. Okuda, M. Hashimoto, K. Sumi, and K. Sasaki : “Robust Picture Matching Using Optimum Selection of Partial Template”, IEEJ Trans. EIS, Vol. 124, No. 3, pp. 629-636 (2004) (in Japanese)

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