Measurement of Complex Permittivity normal to Substrates for Medium-loss Materials Using a PTFE Loaded Balanced-type Circular Disk Resonator at Microwave and Millimeter Wave Frequencies

Author:

Hirayama Naoki1,Yoshikawa Hiromichi1,Nakayama Akira1,Shimizu Takashi2,Kogami Yoshinori2

Affiliation:

1. R&D Center, Kyocera Corporation

2. Graduate School of Engineering, Utsunomiya University

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering

Reference17 articles.

1. (1) Y. Kobayashi : “Microwave Evaluation Techniques of Copper-Clad Dielectric Laminate Substrates”, IEICE Trans. C, Vol. J89-C, No. 5, pp. 210-216 (2006) (in Japanese)

2. 小林禧夫:「銅張り誘電体積層基板のマイクロ波評価技術」, 信学論C, Vol. J89-C, No. 5, pp. 210-216 (2006)

3. (2) Y. Kobayashi and A. Nakayama : “Round robin test on a cavity resonance method to measure complex permittivity of dielectric plates at microwave frequency”, IEEE Trans. Dielectrics Electrical Insulation, Vol. 13, No. 4, pp. 751-759 (2006)

4. (3) T. Shimizu and Y. Kobayashi : “Cut-off circular waveguide method for dielectric substrate measurement in millimeter wave range”, IEICE Trans. Electron, Vol. E87-C, No. 5 (2004)

5. (4) H. Kawabata, K. Hasuike, Y. Kobayashi, and Z-W Ma : “Multi-frequency measurements of complex permittivity of dielectric plates using higher-order modes of a balanced-type circular disk resonator”, Proc. 36th EuMC, pp. 388-391 (2006)

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