Measurement of Complex Permittivity normal to Substrates for Medium-loss Materials Using a PTFE Loaded Balanced-type Circular Disk Resonator at Microwave and Millimeter Wave Frequencies
Author:
Affiliation:
1. R&D Center, Kyocera Corporation
2. Graduate School of Engineering, Utsunomiya University
Publisher
Institute of Electrical Engineers of Japan (IEE Japan)
Subject
Electrical and Electronic Engineering
Link
https://www.jstage.jst.go.jp/article/ieejeiss/141/8/141_842/_pdf
Reference17 articles.
1. (1) Y. Kobayashi : “Microwave Evaluation Techniques of Copper-Clad Dielectric Laminate Substrates”, IEICE Trans. C, Vol. J89-C, No. 5, pp. 210-216 (2006) (in Japanese)
2. 小林禧夫:「銅張り誘電体積層基板のマイクロ波評価技術」, 信学論C, Vol. J89-C, No. 5, pp. 210-216 (2006)
3. (2) Y. Kobayashi and A. Nakayama : “Round robin test on a cavity resonance method to measure complex permittivity of dielectric plates at microwave frequency”, IEEE Trans. Dielectrics Electrical Insulation, Vol. 13, No. 4, pp. 751-759 (2006)
4. (3) T. Shimizu and Y. Kobayashi : “Cut-off circular waveguide method for dielectric substrate measurement in millimeter wave range”, IEICE Trans. Electron, Vol. E87-C, No. 5 (2004)
5. (4) H. Kawabata, K. Hasuike, Y. Kobayashi, and Z-W Ma : “Multi-frequency measurements of complex permittivity of dielectric plates using higher-order modes of a balanced-type circular disk resonator”, Proc. 36th EuMC, pp. 388-391 (2006)
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