Investigation of Water Tree Degradation in Dry-cured and Extruded Three-layer (E-E Type) 6.6kV Removed XLPE Cables-Reference-Cited by-同舟云学术

Investigation of Water Tree Degradation in Dry-cured and Extruded Three-layer (E-E Type) 6.6kV Removed XLPE Cables

Published:2016 Issue:3 Volume:136 Page:333-343
ISSN:0385-4213
Container-title:IEEJ Transactions on Power and Energy
language:en
Short-container-title:IEEJ Trans. PE

Author:

Kurihara Takashi¹,Tsutsui Eiji²,Nakanishi Eiji³,Maki Kiyoshi⁴,Murakawa Kenichi⁵,Morimoto Koji⁶,Takahashi Toshihiro¹,Okamoto Tatsuki¹

Affiliation:

1. Central Research Institute of Electric Power Industry

2. Shikoku Electric Power Co., Inc.

3. Shikoku Research Institute, Inc.

4. The Chugoku Electric Power Co., Inc.

5. Kyushu Electric Power Co., Inc.

6. The Kansai Electric Power Co., Inc.

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology

Link

https://www.jstage.jst.go.jp/article/ieejpes/136/3/136_333/_pdf

Reference11 articles.

1. (3) T. Hashizume, C. Shinoda, and T. Tani: “A Consideration on the Residual AC Breakdown Voltage of Immersed Dry-Cured XLPE Power Cables under Accelerated Aging Test”, T. IEE Japan, Vol. 111-A, No. 7, pp. 659-666 (1991) (in Japanese)

2. (6) T. Hyodo and M. Nakade: “Consideration of Water Tree Growth for Relative Humidity in XLPE (II)”, 2009 National Convention Record IEE Japan, No. 7-201, pp. 316-317 (2009) (in Japanese)

3. (7) T. Kuraishi, T. Takahashi, T. Kurihara, H. Suzuki, and T. Okamoto: “Detection of Small Water Tree Degradation in XLPE Power Cables—Partial Discharge Discrimination Method—”, CRIEPI Research Report, No. H10015 (2011) (in Japanese)

4. (10) H. Hirose: “Theoretical Foundation for Residual Lifetime Estimation”, T. IEE Japan, Vol. 116-B, No. 2, pp. 168-173 (1996) (in Japanese)

5. (11) H. Goshima and M. Yashima: “Feasibility of Decision of Replacement Time by Executing Insulation Tests to Aged Power Equipment—Estimation of Cumulative Insulation Fault Probability under Different Levels of Voltage Application—”, CRIEPI Research Report, No. H06016 (2007) (in Japanese)