Monte Carlo Simulation of Microparticle Motion in Vacuum Gap
Author:
Affiliation:
1. Graduate School of Engineering, The University of Tokyo
2. Advanced Technology R&D Center, Mitsubishi Electric Corp.
Publisher
Institute of Electrical Engineers of Japan (IEE Japan)
Subject
Electrical and Electronic Engineering,Energy Engineering and Power Technology
Link
https://www.jstage.jst.go.jp/article/ieejpes/138/7/138_628/_pdf
Reference20 articles.
1. (1) T. Kamikawaji, T. Shioiri, T. Funahashi, Y. Satoh, E. Kaneko, and I. Ohshima: “An investigation into major factors in shunt capacitor switching performances by vacuum circuit breakers with copper-chromium contacts”, IEEE Trans. Power Del., Vol. 8, No. 4, pp. 1789-1795 (1993)
2. (2) T. Shioiri, T. Kamikawaji, K. Matsuo, E. Kaneko, M. Ohkawa, and I. Ohshima: “Breakdown Characteristics under Metallic Particle Contaminated Conditions in Vacuum Gap”, T. IEE Japan, Vol. 113-B, No. 4, pp. 313-319 (1993) (in Japanese)
3. (3) G. A. Farrall and F. G. Hudda: “The effect of glass debris on electron emission and electrical breakdown of vacuum interrupters”, IEEE Trans. Electr. Insul., Vol. EI-15, No. 2, pp. 61-67 (1980)
4. (4) G. A. Farrall, F. G. Hudda, and R. H. Johnston: “The effect of alumina inclusions on the breakdown and emission properties of copper surfaces in vacuum”, J. Appl. Phys., Vol. 50, No. 5, pp. 3608-3614 (1979)
5. (6) M. Hara and M. Akazaki: “A Method for prediction of Discharge Threshold Voltage in the Presence of a Conducting Particle”, J. Electrostatics, Vol. 2, No. 3, pp. 223-239 (1976/1977)
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