1. (1) IEC 61083-2 Ed. 2 (draft): “Instruments and software used for measurements in high-voltage and high-current tests—Part 2: Requirements for software for impulse tests” (2011-5)
2. (2) IEC 61083-4 Ed. 1 (draft): “Instruments and software used for measurements in high-voltage and high-current tests-Part 4: Requirements for software for tests with alternating and direct currents and voltages” (2011-7)
3. (3) S. Sato, S. Sakaguchi, K. Futamata, and K. Katou: “Coil Optimisation for Homogeneous Magnetic Field with Small Leakage Field”, IEEE Trans. Magn., Vol. 36, No. 4, pp. 649-653 (2000-6)
4. (4) S. Sato, S. Nishimura, H. Shimizu, Y. Saikawa, and Y. Okamoto: “IEC 61083-4 TDG Steady State a. c. Waveform Analysis”, 2012 National Convention Record IEE Japan, Vol. 7, No. 084, pp. 124-125 (2012-3) (Japanese)
5. (5) Y. Saikawa, S. Sato, Y. Okamoto, S. Nishimura, and H. Shimizu: “Proposal of Transient a. c. Waveform Analysis Technique for IEC 61083-4”, 2013 National Convention Record IEE Japan, Vol. 7, No. 083, pp. 122-123 (2013-3) (Japanese)