High-current Measurements in High Power Tests —Standardization Trend and STL Shunt Round Robin Project-Reference-Cited by-同舟云学术

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High-current Measurements in High Power Tests —Standardization Trend and STL Shunt Round Robin Project

Published:2017 Issue:9 Volume:137 Page:606-609
ISSN:1340-5551
Container-title:The Journal of the Institute of Electrical Engineers of Japan
language:en
Short-container-title:IEEJ Journal

Author:

GODA Yutaka

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering

Link

https://www.jstage.jst.go.jp/article/ieejjournal/137/9/137_606/_pdf

Reference2 articles.

1. (2) Y. Goda, M. Kim, A. Wang, and G. Sengupta : “Comparison Tests of High Current Shunts in High Power Laboratories in Asia with an STL Reference Shunt”, 2012 IEEE Power & Energy Society Transmission and Distribution Conference and Exposition (2012)

2. (4) IEC 62475 Ed.1.0 2010-9 : High-current test techniques : Definitions and requirements for test currents and measuring systems

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