Helium Film Profile on a Gold and a Quartz Substrate

Abstract

The thickness of the static saturated helium film has been measured by an ellipsometric technique on a gold substrate at 2.13 °K and on a quartz substrate at 2.10 °K. The height, H, and the thickness of the film, d, are related by H = const. × d−n where n = 3.91 ± 0.15 and d = 323 ± 3 Å at H = 1 cm for the gold substrate. For the quartz substrate n = 3.08 ± 0.13 and d = 228 ± 2 Å at H = 1 cm; except that for thicknesses greater than 250 Å, the profile appears to steepen.