Interférométrie et réflectométrie haute résolution en lumière incohérente : modélisation d'interférogrammes

Abstract

We report on low-coherence, near-infrared reflectometry applied to optical fibres, waveguides, and coupling devices to detect the echoes due to reflective propagation defects and measure their optical properties — losses or attenuation, dispersion. This technique, based on interferometry, leads to the highest spatial resolution and the lowest detectable reflected optical power. We scan the reference arm of our Michelson interferometer around the ``white light fringe'' position and obtain interferograms whose envelopes and fringes contain information on the light source spectrum and the reflectivity of the test arm. Theoretical and experimental results are compared. Examples are given and show that numerical simulations are needed to understand the signatures of the reflectors and get to their physical structures.