Diagnostic Potential of The VUV&XUV Imaging Spectroscopy-Reference-Cited by-同舟云学术

Diagnostic Potential of The VUV&XUV Imaging Spectroscopy

Published:2003-01 Issue:1T Volume:43 Page:231-236
ISSN:1536-1055
Container-title:Fusion Science and Technology
language:en
Short-container-title:Fusion Science and Technology

Author:

Piffl V.¹,Weinzettl Vl.¹,Burdakov A.²,Polosatkin S.²

Affiliation:

1. Institute of Plasma Physics, Association EUROATOM-IPP.CR, Academy of Sciences of the Czech Republic, Za Slovankou 3, P.O. Box 17, 182 21 Prague 8, Czech Republic ,

2. Budker Institute of Nuclear Physics, Novosibirsk, Russia ,

Publisher

Informa UK Limited

Subject

Mechanical Engineering,General Materials Science,Nuclear Energy and Engineering,Nuclear and High Energy Physics,Civil and Structural Engineering

Link

https://www.tandfonline.com/doi/pdf/10.13182/FST03-A11963601

Reference4 articles.

1. Ultra-Soft X-Ray Spectroscopy Using Multilayer Mirror

2. Laboratory test of a LSM‐based narrow bandpass and high throughput camera for Tokamak plasma imaging between 100 and 200 Å

3. V. Piffl, J. Badalec, V.I. Weinzettl, A. Burdakov:Intensity radial profile study of CV(308 eV) line at tokamak CASTOR, 28thEPS Conference, Madeira, June 18-22 June 2001, P 3.085 http://www.cfn.ist.utl.pt/EPS2001/fin/pdf/P3.085.pdf

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