Data Acquisition and Management System of LHD-Reference-Cited by-同舟云学术

Data Acquisition and Management System of LHD

Published:2010-08 Issue:1 Volume:58 Page:445-457
ISSN:1536-1055
Container-title:Fusion Science and Technology
language:en
Short-container-title:Fusion Science and Technology

Author:

Nakanishi H.¹,Ohsuna M.¹,Kojima M.¹,Imazu S.¹,Nonomura M.¹,Hasegawa M.²,Nakamura K.²,Higashijima A.²,Yoshikawa M.³,Emoto M.⁴,Yamamoto T.⁴,Nagayama Y.⁴,Kawahata K.⁴,

Affiliation:

1. LABCOM Group, National Institute for Fusion Science, Toki 509-5292, Japan

2. Research Institute for Applied Mechanics, Kyushu University, Kasuga 816-8580, Japan

3. Plasma Research Center, University of Tsukuba, Tsukuba 305-8577, Japan

4. National Institute for Fusion Science, Toki 509-5292, Japan

Publisher

Informa UK Limited

Subject

Mechanical Engineering,General Materials Science,Nuclear Energy and Engineering,Nuclear and High Energy Physics,Civil and Structural Engineering

Link

https://www.tandfonline.com/doi/pdf/10.13182/FST10-A10830

Reference38 articles.

1. CODAS: The JET Control and Data Acquisition System

2. Trends in computing systems for large fusion experiments

3. Overview of quasi-single helicity experiments in reversed field pinches

4. Test results on systems developed for the SST-1 tokamak

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Demonstration of aneutronic p-¹¹B reaction in a magnetic confinement device;Nuclear Fusion;2024-08-02

2. Observation of energetic ion anisotropy using neutron diagnostics in the Large Helical Device;Nuclear Fusion;2024-05-21

3. The multi-sightline compact D-D neutron spectrometers based on CLYC7-scintillator for beam ion anisotropy study in LHD;Journal of Instrumentation;2024-03-01

4. Development of a High Sampling Rate Data Acquisition System Working in a High Pulse Count Rate Region for Radiation Diagnostics in Nuclear Fusion Plasma Research;Electronics;2023-09-15

5. Gamma ray diagnostics for high time resolution measurement in large helical device;Journal of Instrumentation;2023-09-01